[1] A. Afshar, A.G. Dolati and M. Ghorbani,
Mater. Chem. Phys.,
2003,
77(
2), 352–358.
[2] F.M. Takata and P.T.A. Sumodjo,
Electrochim. Acta,
2007,
52(
20), 6089–6096.
[3] Y. Ito, A. Miyazaki, S. Valiyaveettil and T. Enoki,
J. Phys. Chem. C,
2010,
114(
27), 11699–11702.
[4] H. Liu, F. Wang, Y. Zhao, J. Liu, K.C. Park and M. Endo,
J. Electroanal. Chem.,
2009,
633(
1), 15–18.
[5] B. Jeon, S. Yoon and B.Y. Yoo,
Electrochim. Acta,
2010,
56(
1), 401–405.
[6] N. Tasaltın, S. Öztürk, N. Kılınc, H. Yüzer and Z.Z. Öztürk,
J. Alloys Compd.,
2011,
509(
9), 3894–3898.
[7] F. Wang, S. Doi, K. Hosoiri, H. Yoshida, T. Kuzushima, M. Sasadaira and T. Watanabe,
Electrochim. Acta,
2006,
51(
20), 4250–4254.
[8] T. Edler, S. Hamann, A. Ludwig and S.G. Mayr,
Scr. Mater.,
2011,
64(
1), 89–92.
[9] S. Hamann, M.E. Gruner, S. Irsen, J. Buschbeck, C. Bechtold, I. Kock, S.G. Mayr, A. Savan, S. Thienhaus, E. Quandt, S. Fahler, P. Entel and A. Ludwig,
Acta Mater,
2010,
58(
18), 5949–5961.
[10] V. Haehnel, C. Mickel, S. Fahler, L. Schultz and H. Schlorb,
J. Phys. Chem. C,
2010,
114(
45), 19278–19283.
[11] V. Haehnel, S. Fahler, L. Schultz and H. Schlorb,
Electrochem. Commun.,
2010,
12(
8), 1116–1119.
[12] S.A. Wilson and et al,
Mater. Sci. Eng. R,
2007,
56(
1-6), 1–129.
[13] S. Inoue, K. Inoue, K. Koterazawa and K. Mizuuchi,
Mater. Sci. Eng. A,
2003,
339(
120), 29–34.
[14] J. Buschbeck, I. Lindemann, L. Schultz and S. Fahler,
Phys. Rev. B,
2007,
76(
20), 205421.
[15] H. Shima, K. Oikawa, A. Fujita, K. Fukamichi and K. Ishida, J. Magn. Magn. Mater., 2004, 272, 2173–2174.
[16] M. Rezaei, M. Ghorbani and A. Dolati,
Electrochim. Acta,
2010,
56(
1), 483–490.
[17] F.M. Takata, G. Pattanaik, W.A. Soffa, P.T.A. Sumodjo and G. Zangari,
Electrochem. Commun.,
2008,
10(
4), 568–571.
[18] S. Doi, F. Wang, K. Hosoiri and T. Watanabe,
Mater. Trans.,
2003,
44(
4), 649–652.
[19] K.J. Bryden and J.Y. Ying,
J. Electrochem. Soc,
1998,
145(
10), 3339–3346.
[20] S.C. Hernandez, B.Y. Yoo, E. Stefanescu, S. Khizroev and N.V. Myung,
Electrochim. Acta,
2008,
53(
18), 5621–5627.
[21] D. Pečko, K.Ž. Rožman, P.J. McGuiness, B. Pihlar and S. Kobe,
J. Appl. Phys.,
2010,
107(
9), 09A712.
[22] K.Ž. Rozman, D. Pečko, L. Suhodolčan, P.J. McGuiness and S. Kobe,
J. Alloys Compd.,
2011,
509(
2), 551–555.
[23] M.A. Meyers, A. Mishra and D.J. Benson,
Prog. Mater. Sci.,
2006,
51(
4), 427–556.
[24] K. Sekiguchi, M. Shimizu, E. Saitoh and H. Miyajima,
J. Magn. Magn. Mater.,
2004,
282, 143–146.
[25] M. Rezaei, Synthesis and characterization of Fe-Pd shape memory thin films by electrodeposition, Master Thesis Department of Materials Science and Engineering, Sharif University of Technology. Iran, 2010.
[26] M. Ghorbani, A. Iraji zad, A. Dolati and R. Ghasempour,
J. Alloys Compd.,
2005,
386(
1-2), 43–46.
[27] E. Gomez, A. Labarta, A. Llorente and E. Valles,
J. Electroanal. Chem.,
2001,
517(
1-2), 63–68.
[28] I. Bakonyi and L. Peter,
Prog. Mater. Sci.,
2010,
55(
3), 107–245.
[29] F. Xiao, C. Hangarter, B. Yoo, Y. Rheem, K. Lee and N.V. Myung,
Electrochim. Acta,
2008,
53(
28), 8103–8117.
[30] A.J. Bard, R. Parsons and J. Jordan, Standard Potentials in Aqueous Solutions. Marcel Dekker, New York, 1985.
[31] R.N. Goldberg and L.H. Hepler,
Chem. Rev.,
1968,
68(
2), 229–252.
[32] E.M. Martell and R.M. Smith, Critical Stabilities Constants. Plenum Press, New York, 1989.
[33] M. Rezaei, S.H. Tabaian and D.F. Haghshenas,
Electrochim. Acta,
2012,
59, 360–366.
[34] M. Rezaei, S.H. Tabaian and D.F. Haghshenas,
J. Electroanal. Chem.,
2012,
687, 95–101.
[35] M. Rezaei, S.H. Tabaian and D.F. Haghshenas,
Electrochim. Acta,
2013,
87, 381–387.
[36] M. Rezaei, S.H. Tabaian and D.F. Haghshenas,
J. Mater. Chem. A,
2014,
2(
13), 4588–4597.
[37] A. Brenner, Electrodeposition of Alloys, Vol. 1 and 2. Academic Press, New York and Landon, 1963.
[38] D. Landolt,
Electrochim. Acta,
1994,
39(
8-9), 1075–1090.
[39] A.G. Dolati, M. Ghorbani and A. Afshar,
Surf. Coat. Tech.,
2003,
166, 105–110.
[40] A.E. Alvarez and D.R. Salinas,
Electrochim. Acta,
2010,
55(
11), 3714–3720.
[41] A.E. Alvarez and D.R. Salinas,
J. Electroanal. Chem.,
2004,
566(
2), 393–400.
[42] A. Milchev, Electrocrystallization: Fundamentals of Nucleation and Growth. Kluwer Academic Publishers, Boston, 2002.
[43] A. Dolati, M. Ghorbani and M.R. Ahmadi,
J. Electroanal. Chem,
2005,
577(
1), 1–8.
[44] L. Soleimany, A. Dolati and M. Ghorbani,
J. Electroanal. Chem.,
2010,
645(
1), 28–34.
[45] B. Scharifker and G. Hills,
Electrochim. Acta,
1983,
28(
7), 879–889.
[46] B.R. Scharifker and J. Mostany,
Electroanal. Chem.,
1984,
177(
1-2), 13–23.
[47] L. Heerman and A. Tarallo,
J. Electroanal. Chem.,
1998,
451(
1-2), 101–109.
[48] L. Heerman and A. Tarallo,
J. Electroanal. Chem.,
1999,
470(
1), 70–76.
[49] Z. Zhang and D.P. Barkey,
J. Electrochem. Soc.,
2007,
154(
10), D550–D556.
[50] A. Sahari, A. Azizi, G. Schmerber, M. Abes, J.P. Bucher and A. Dinia,
Catal. Today,
2006,
113(
3-4), 257–262.
[51] C. Han, Q. Liu and D.G. Ivey,
Electrochim. Acta,
2009,
54(
12), 3419–3427.
[52] A.S. Taguchi, F.R. Bento and L.H. Mascaro,
J. Braz. Chem. Soc.,
2008,
19(
4), 727–733.
[53] S.P. Gou and I.W. Sun,
Electrochim. Acta,
2008,
53(
5), 2538–2544.
[54] E. Nouri and A. Dolati,
Mater. Res. Bull.,
2007,
42(
9), 1769–1776.
[55] A.N. Correia, M.X. Façanha and P. de Lima-Neto,
Surf. Coat. Tech.,
2007,
201(
16-17), 7216–7221.
[56] A. Dolati, M. Sababi, E. Nouri and M. Ghorbani,
Mater. Chem. Phys.,
2007,
102(
2-3), 118–124.
[57] S. Basavanna and Y.A. Naik,
J. Appl. Electrochem.,
2009,
39(
120), 1975–1982.
[58] I. Petersson and E. Ahlberg,
J. Electroanal. Chem.,
2000,
485(
2), 166–177.
[59] F.R. Bento and L.H. Mascaro,
Surf. Coat. Tech.,
2006,
201, 1752–1756.
[60] A.N. Correia, R.C.B. de Oliveira and P. de Lima-Neto,
J. Braz. Chem. Soc.,
2006,
17(
1), 90–97.
[61] Z.N. Yang, Z. Zhang and J.Q. Zhang,
Surf. Coat. Tech.,
2006,
200(
16-17), 4810–4815.
[62] M. Jayakumar, K.A. Venkatesan, T.G. Srinivasan and P.R. Vasudeva Rao,
Electrochim. Acta,
2009,
54(
26), 6747–6755.
[63] H.J. Yun, S.M.S.I. Dulal, C.B. Shin and C.K. Kim,
Electrochim. Acta,
2008,
54(
2), 370–375.
[64] S.M.S.I. Dulal, H.J. Yun, C.B. Shin and C.K. Kim,
Electrochim. Acta,
2007,
53(
2), 934–943.
[65] I. Tabakovic, J. Qiu, S. Riemer, M. Sun, V. Vas’ko and M. Kief,
Electrochim. Acta,
2008,
53(
5), 2483–2493.
[66] M.R. Khelladi, L. Mentar, M. Boubatra, A. Azizi and A. Kahoul,
Mater. Chem. Phys.,
2010,
122(
2-3), 449–453.
[67] E. Gomez, E. Guaus, F. Sanz and E. Valles,
J. Electroanal. Chem.,
1999,
465(
1), 63–71.
[68] W. Plieth, Electrochemistry for Materials Science. Elsevier, Amsterdam, 2008.
[69] B.D. Cullity, Elements of X-ray Diffraction. Second Ed.Addison-Wesley Pub. Co., Reading, MA, 1978.
[70] J.R. Ares, A. Pascual, I.J. Ferrer and C. Sanchez, Thin Solid Films, 2005, 480, 477–481.